TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_07_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-011-06 | FUSED_ID : 6359364768399147190
  IC_TEMP :  -47.14 | VDDM : 1132.47 | AUX_INT :   -5.30 | CsaBias :   79.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.04976e-04 / 2
  ADC_P0  : -5.29806e-03 ± 2.04155e-02
  ADC_P1  : 7.71474e-03 ± 4.82015e-04
  ADC_P2  : -4.02393e-06 ± 2.24318e-06
  CSA_Chi2/NDF : 7.84941e-05 / 2
  CSA_P0  : 6.13844e-02 ± 5.90936e-03
  CSA_P1  : 9.21796e-03 ± 4.45228e-04
  CSA_P2  : -3.69360e-05 ± 6.78030e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 30, 37, 95, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 26, 30, 35, 43, 75, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3604', '1.800', '0.1356', '1.800', '0.0990', '7.000', '0.7090', 1, 1, 1, 1, 1726142873.548678]
VI_after__Init : ['1.202', '0.3605', '1.800', '0.1356', '1.800', '0.0917', '7.000', '0.7080', 1, 1, 1, 1, 1726142881.7590287]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1384', '1.800', '0.1094', '7.000', '0.7090', 1, 1, 1, 1, 1726142949.670789]