TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_09_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-012-06 | FUSED_ID : 6359364768399147206
  IC_TEMP :  -49.14 | VDDM : 1128.23 | AUX_INT :   -6.56 | CsaBias :   81.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.47898e-04 / 2
  ADC_P0  : -6.56128e-03 ± 1.97441e-02
  ADC_P1  : 8.08231e-03 ± 4.80883e-04
  ADC_P2  : -4.63322e-06 ± 2.32194e-06
  CSA_Chi2/NDF : 1.20876e-04 / 2
  CSA_P0  : 6.24665e-02 ± 7.33319e-03
  CSA_P1  : 1.00269e-02 ± 5.52503e-04
  CSA_P2  : -4.64855e-05 ± 8.41396e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [19, 23, 57, 64, 107, 112, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [8, 58, 102, 115, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2369', '1.800', '0.1679', '1.800', '0.0884', '7.000', '0.7080', 1, 1, 1, 1, 1726142969.9962075]
VI_after__Init : ['1.202', '0.2370', '1.800', '0.1679', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1726142978.227593]
VI_at__the_End : ['1.202', '0.5040', '1.800', '0.1408', '1.800', '0.1128', '7.000', '0.7087', 1, 1, 1, 1, 1726143046.3301718]