TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_11_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-013-06 | FUSED_ID : 6359364768399147222
  IC_TEMP :  -48.37 | VDDM : 1132.88 | AUX_INT :   -7.97 | CsaBias :   89.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13385e-03 / 2
  ADC_P0  : -7.97304e-03 ± 2.28320e-02
  ADC_P1  : 8.20558e-03 ± 5.54964e-04
  ADC_P2  : -5.17817e-06 ± 2.67967e-06
  CSA_Chi2/NDF : 1.09076e-04 / 2
  CSA_P0  : 6.07115e-02 ± 6.96607e-03
  CSA_P1  : 9.96552e-03 ± 5.24843e-04
  CSA_P2  : -4.46149e-05 ± 7.99274e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [47, 54, 63, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [7, 12, 14, 58, 61, 85, 91, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3264', '1.800', '0.1956', '1.800', '0.0931', '7.000', '0.7079', 1, 1, 1, 1, 1726143067.9305828]
VI_after__Init : ['1.202', '0.3267', '1.800', '0.1954', '1.800', '0.0873', '7.000', '0.7079', 1, 1, 1, 1, 1726143076.1129556]
VI_at__the_End : ['1.202', '0.5078', '1.800', '0.1421', '1.800', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1726143141.2549062]