TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_14_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-015-06 | FUSED_ID : 6359364768399147254
  IC_TEMP :  -51.80 | VDDM : 1117.86 | AUX_INT :   -7.45 | CsaBias :   82.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00834e-03 / 2
  ADC_P0  : -7.44801e-03 ± 2.14863e-02
  ADC_P1  : 8.20385e-03 ± 5.14455e-04
  ADC_P2  : -5.82228e-06 ± 2.43461e-06
  CSA_Chi2/NDF : 7.71441e-05 / 2
  CSA_P0  : 5.94119e-02 ± 5.85833e-03
  CSA_P1  : 9.51067e-03 ± 4.41383e-04
  CSA_P2  : -4.03357e-05 ± 6.72174e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [28, 43, 59, 64, 67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 33, 50, 51, 74, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1567', '1.800', '0.1619', '1.800', '0.0850', '7.000', '0.7079', 1, 1, 1, 1, 1726143262.31652]
VI_after__Init : ['1.202', '0.1565', '1.800', '0.1618', '1.800', '0.0800', '7.000', '0.7083', 1, 1, 1, 1, 1726143270.4098558]
VI_at__the_End : ['1.202', '0.4943', '1.800', '0.1561', '1.800', '0.1107', '7.000', '0.7087', 1, 1, 1, 1, 1726143337.791556]