TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_17_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-017-01 | FUSED_ID : 6359364768399147281
  IC_TEMP :  -54.99 | VDDM : 1132.03 | AUX_INT :   -5.98 | CsaBias :   74.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.80716e-04 / 2
  ADC_P0  : -5.98407e-03 ± 2.12057e-02
  ADC_P1  : 8.14354e-03 ± 5.10412e-04
  ADC_P2  : -5.43964e-06 ± 2.42641e-06
  CSA_Chi2/NDF : 9.04195e-05 / 2
  CSA_P0  : 5.92023e-02 ± 6.34240e-03
  CSA_P1  : 9.56568e-03 ± 4.77854e-04
  CSA_P2  : -4.21759e-05 ± 7.27715e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [10, 11, 17, 37, 59, 113, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [0, 19, 28, 35, 61, 70, 100, 108, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2752', '1.800', '0.1176', '1.800', '0.0865', '7.000', '0.7083', 1, 1, 1, 1, 1726143457.1922805]
VI_after__Init : ['1.202', '0.2752', '1.800', '0.1175', '1.800', '0.0816', '7.000', '0.7080', 1, 1, 1, 1, 1726143465.2086413]
VI_at__the_End : ['1.202', '0.4911', '1.800', '0.1389', '1.800', '0.1122', '7.000', '0.7083', 1, 1, 1, 1, 1726143531.319592]