TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_19_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-018-01 | FUSED_ID : 6359364768399147297
  IC_TEMP :  -49.60 | VDDM : 1131.32 | AUX_INT :   -7.57 | CsaBias :   83.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.71184e-04 / 2
  ADC_P0  : -7.56770e-03 ± 2.11067e-02
  ADC_P1  : 8.32000e-03 ± 5.19089e-04
  ADC_P2  : -5.44308e-06 ± 2.53378e-06
  CSA_Chi2/NDF : 1.06076e-04 / 2
  CSA_P0  : 6.11557e-02 ± 6.86961e-03
  CSA_P1  : 9.82552e-03 ± 5.17575e-04
  CSA_P2  : -4.30209e-05 ± 7.88206e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [3, 7, 12, 28, 79, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [14, 28, 31, 38, 63, 85, 86, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2499', '1.800', '0.1799', '1.800', '0.0835', '7.000', '0.7077', 1, 1, 1, 1, 1726143555.0186121]
VI_after__Init : ['1.202', '0.2499', '1.800', '0.1796', '1.800', '0.0779', '7.000', '0.7079', 1, 1, 1, 1, 1726143563.183083]
VI_at__the_End : ['1.202', '0.5081', '1.800', '0.1418', '1.800', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1726143622.25632]