TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_20_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-019-01 | FUSED_ID : 6359364768399147313
  IC_TEMP :  -63.01 | VDDM : 1119.90 | AUX_INT :   -7.23 | CsaBias :   74.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07436e-03 / 2
  ADC_P0  : -7.23191e-03 ± 2.21687e-02
  ADC_P1  : 8.22018e-03 ± 5.29656e-04
  ADC_P2  : -5.85168e-06 ± 2.50875e-06
  CSA_Chi2/NDF : 1.77159e-04 / 2
  CSA_P0  : 5.79475e-02 ± 8.87777e-03
  CSA_P1  : 1.01150e-02 ± 6.68876e-04
  CSA_P2  : -5.21402e-05 ± 1.01862e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [20, 27, 42, 57, 79, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [13, 58, 95, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2605', '1.800', '0.1445', '1.800', '0.0897', '7.000', '0.7078', 1, 1, 1, 1, 1726143652.1799786]
VI_after__Init : ['1.202', '0.2603', '1.800', '0.1443', '1.800', '0.0840', '7.000', '0.7077', 1, 1, 1, 1, 1726143660.217406]
VI_at__the_End : ['1.202', '0.4824', '1.800', '0.1398', '1.800', '0.1163', '7.000', '0.7087', 1, 1, 1, 1, 1726143719.4378824]