TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_22_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-020-01 | FUSED_ID : 6359364768399147329
  IC_TEMP :  -55.90 | VDDM : 1129.78 | AUX_INT :   -9.14 | CsaBias :   81.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29829e-03 / 2
  ADC_P0  : -9.13532e-03 ± 2.43954e-02
  ADC_P1  : 8.30044e-03 ± 5.86645e-04
  ADC_P2  : -5.87602e-06 ± 2.80654e-06
  CSA_Chi2/NDF : 1.42429e-04 / 2
  CSA_P0  : 5.69250e-02 ± 7.96014e-03
  CSA_P1  : 1.01803e-02 ± 5.99739e-04
  CSA_P2  : -4.95818e-05 ± 9.13332e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 17, 21, 26, 70, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [5, 22, 60, 68, 78, 79, 90, 103, 105, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3396', '1.800', '0.1451', '1.800', '0.0899', '7.000', '0.7079', 1, 1, 1, 1, 1726143749.4246004]
VI_after__Init : ['1.202', '0.3397', '1.800', '0.1452', '1.800', '0.0840', '7.000', '0.7076', 1, 1, 1, 1, 1726143757.715826]
VI_at__the_End : ['1.202', '0.4960', '1.800', '0.1380', '1.800', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1726143818.2111514]