TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_24_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-021-01 | FUSED_ID : 6359364768399147345
  IC_TEMP :  -51.71 | VDDM : 1130.87 | AUX_INT :   -6.67 | CsaBias :   81.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01798e-03 / 2
  ADC_P0  : -6.66945e-03 ± 2.15819e-02
  ADC_P1  : 8.04821e-03 ± 5.06563e-04
  ADC_P2  : -5.62205e-06 ± 2.35114e-06
  CSA_Chi2/NDF : 5.86419e-05 / 2
  CSA_P0  : 6.01782e-02 ± 5.10771e-03
  CSA_P1  : 9.12955e-03 ± 3.84829e-04
  CSA_P2  : -3.48589e-05 ± 5.86050e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 4, 26, 58, 67, 81, 120, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 20, 73]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1906', '1.800', '0.1559', '1.800', '0.0844', '7.000', '0.7075', 1, 1, 1, 1, 1726143846.919431]
VI_after__Init : ['1.201', '0.1906', '1.800', '0.1559', '1.800', '0.0787', '7.000', '0.7074', 1, 1, 1, 1, 1726143854.9849813]
VI_at__the_End : ['1.202', '0.4942', '1.800', '0.1391', '1.800', '0.1111', '7.000', '0.7082', 1, 1, 1, 1, 1726143913.6814659]