TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_25_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-022-01 | FUSED_ID : 6359364768399147361
  IC_TEMP :  -50.63 | VDDM : 1127.31 | AUX_INT :   -7.30 | CsaBias :   74.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34608e-03 / 2
  ADC_P0  : -7.29891e-03 ± 2.49141e-02
  ADC_P1  : 8.21739e-03 ± 6.10889e-04
  ADC_P2  : -4.95315e-06 ± 2.97713e-06
  CSA_Chi2/NDF : 1.14731e-04 / 2
  CSA_P0  : 5.81577e-02 ± 7.14436e-03
  CSA_P1  : 9.98217e-03 ± 5.38276e-04
  CSA_P2  : -4.51681e-05 ± 8.19730e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [32, 36, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 25, 50, 85, 94, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3741', '1.800', '0.1440', '1.800', '0.0928', '7.000', '0.7076', 1, 1, 1, 1, 1726143944.2516165]
VI_after__Init : ['1.202', '0.3742', '1.800', '0.1439', '1.800', '0.0871', '7.000', '0.7076', 1, 1, 1, 1, 1726143952.4201007]
VI_at__the_End : ['1.202', '0.5046', '1.800', '0.1387', '1.800', '0.1105', '7.000', '0.7082', 1, 1, 1, 1, 1726144021.4597318]