TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_28_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-024-01 | FUSED_ID : 6359364768399147393
  IC_TEMP :  -51.16 | VDDM : 1123.39 | AUX_INT :   -6.41 | CsaBias :   94.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06387e-03 / 2
  ADC_P0  : -6.40934e-03 ± 2.21325e-02
  ADC_P1  : 7.82109e-03 ± 5.22256e-04
  ADC_P2  : -4.24350e-06 ± 2.44637e-06
  CSA_Chi2/NDF : 7.73809e-05 / 2
  CSA_P0  : 6.04498e-02 ± 5.86731e-03
  CSA_P1  : 9.45100e-03 ± 4.42060e-04
  CSA_P2  : -3.87207e-05 ± 6.73204e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 51, 58, 75, 108, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [35, 50, 84, 90, 101, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2789', '1.800', '0.1571', '1.800', '0.0849', '7.000', '0.7076', 1, 1, 1, 1, 1726144138.4762135]
VI_after__Init : ['1.202', '0.2791', '1.800', '0.1571', '1.800', '0.0792', '7.000', '0.7074', 1, 1, 1, 1, 1726144147.3096466]
VI_at__the_End : ['1.202', '0.4983', '1.800', '0.1383', '1.800', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1726144215.2230716]