TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_30_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-025-01 | FUSED_ID : 6359364768399147409
  IC_TEMP :  -59.58 | VDDM : 1109.44 | AUX_INT :   -9.01 | CsaBias :   66.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29703e-03 / 2
  ADC_P0  : -9.01111e-03 ± 2.43918e-02
  ADC_P1  : 8.44790e-03 ± 5.98657e-04
  ADC_P2  : -6.01875e-06 ± 2.92200e-06
  CSA_Chi2/NDF : 1.58347e-04 / 2
  CSA_P0  : 6.12942e-02 ± 8.39319e-03
  CSA_P1  : 1.02841e-02 ± 6.32366e-04
  CSA_P2  : -5.13636e-05 ± 9.63019e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 13, 16, 27, 36, 100, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [30, 73, 86, 113, 114, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2358', '1.800', '0.1685', '1.800', '0.0870', '7.000', '0.7072', 1, 1, 1, 1, 1726144236.155656]
VI_after__Init : ['1.202', '0.2359', '1.800', '0.1686', '1.800', '0.0817', '7.000', '0.7072', 1, 1, 1, 1, 1726144244.3951385]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1386', '1.800', '0.1146', '7.000', '0.7081', 1, 1, 1, 1, 1726144304.2390547]