TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_32_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-026-01 | FUSED_ID : 6359364768399147425
  IC_TEMP :  -51.60 | VDDM : 1128.11 | AUX_INT :   -6.62 | CsaBias :   88.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07993e-03 / 2
  ADC_P0  : -6.62085e-03 ± 2.22908e-02
  ADC_P1  : 8.00432e-03 ± 5.33783e-04
  ADC_P2  : -4.68223e-06 ± 2.53831e-06
  CSA_Chi2/NDF : 8.07995e-05 / 2
  CSA_P0  : 5.75481e-02 ± 5.99552e-03
  CSA_P1  : 9.35434e-03 ± 4.51719e-04
  CSA_P2  : -3.80220e-05 ± 6.87915e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [2, 17, 48, 53, 71, 73, 83, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 58, 61, 68, 76, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2488', '1.800', '0.1213', '1.800', '0.0866', '7.000', '0.7074', 1, 1, 1, 1, 1726144333.4801266]
VI_after__Init : ['1.202', '0.2489', '1.800', '0.1213', '1.800', '0.0810', '7.000', '0.7070', 1, 1, 1, 1, 1726144341.6585288]
VI_at__the_End : ['1.199', '0.4920', '1.800', '0.1363', '1.800', '0.1109', '7.000', '0.7079', 1, 1, 1, 1, 1726144400.2024913]