TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_33_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-012-027-01 | FUSED_ID : 6359364768399147441
  IC_TEMP :  -54.89 | VDDM : 1123.10 | AUX_INT :   -6.06 | CsaBias :   88.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02689e-03 / 2
  ADC_P0  : -6.05522e-03 ± 2.17523e-02
  ADC_P1  : 7.95787e-03 ± 5.23643e-04
  ADC_P2  : -4.34189e-06 ± 2.50137e-06
  CSA_Chi2/NDF : 1.31601e-04 / 2
  CSA_P0  : 5.84397e-02 ± 7.65159e-03
  CSA_P1  : 9.57387e-03 ± 5.76492e-04
  CSA_P2  : -4.10094e-05 ± 8.77929e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [39, 40, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 23, 25, 44, 53, 72, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3291', '1.800', '0.1240', '1.800', '0.0871', '7.000', '0.7072', 1, 1, 1, 1, 1726144430.7543766]
VI_after__Init : ['1.202', '0.3295', '1.800', '0.1239', '1.800', '0.0817', '7.000', '0.7072', 1, 1, 1, 1, 1726144438.737785]
VI_at__the_End : ['1.202', '0.4960', '1.800', '0.1342', '1.800', '0.1117', '7.000', '0.7079', 1, 1, 1, 1, 1726144507.0059655]