TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_12_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-003-11 | FUSED_ID : 6359364768399151163
  IC_TEMP :  -55.01 | VDDM : 1126.98 | AUX_INT :   -7.37 | CsaBias :   76.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25310e-03 / 2
  ADC_P0  : -7.36649e-03 ± 2.39859e-02
  ADC_P1  : 8.39681e-03 ± 5.89988e-04
  ADC_P2  : -5.85809e-06 ± 2.87708e-06
  CSA_Chi2/NDF : 9.91631e-05 / 2
  CSA_P0  : 5.76405e-02 ± 6.64198e-03
  CSA_P1  : 9.52731e-03 ± 5.00425e-04
  CSA_P2  : -4.05064e-05 ± 7.62088e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 8, 11, 20, 29, 30, 55, 86, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [43, 64, 70, 74, 92, 107, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3865', '1.800', '0.1759', '1.800', '0.0944', '7.000', '0.7089', 1, 1, 1, 1, 1726146763.785099]
VI_after__Init : ['1.202', '0.3867', '1.800', '0.1761', '1.800', '0.0868', '7.000', '0.7080', 1, 1, 1, 1, 1726146771.8944032]
VI_at__the_End : ['1.202', '0.4923', '1.800', '0.1407', '1.800', '0.1128', '7.000', '0.7087', 1, 1, 1, 1, 1726146831.9866853]