TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_11_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-004-11 | FUSED_ID : 6359364768399151179
  IC_TEMP :  -56.32 | VDDM : 1125.39 | AUX_INT :   -6.96 | CsaBias :   77.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07542e-03 / 2
  ADC_P0  : -6.95714e-03 ± 2.21941e-02
  ADC_P1  : 8.51604e-03 ± 5.52435e-04
  ADC_P2  : -6.15043e-06 ± 2.72363e-06
  CSA_Chi2/NDF : 1.36720e-04 / 2
  CSA_P0  : 5.94723e-02 ± 7.79899e-03
  CSA_P1  : 9.84665e-03 ± 5.87598e-04
  CSA_P2  : -4.39931e-05 ± 8.94842e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [20, 36, 40, 44, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [7, 8, 19, 23, 38, 62, 82, 84, 100, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1603', '1.800', '0.1706', '1.800', '0.0826', '7.000', '0.7079', 1, 1, 1, 1, 1726146665.7197924]
VI_after__Init : ['1.202', '0.1604', '1.800', '0.1706', '1.800', '0.0768', '7.000', '0.7077', 1, 1, 1, 1, 1726146674.409131]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1397', '1.800', '0.1131', '7.000', '0.7086', 1, 1, 1, 1, 1726146741.2388682]