TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_07_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-006-11 | FUSED_ID : 6359364768399151211
  IC_TEMP :  -58.78 | VDDM : 1141.35 | AUX_INT : -193.25 | CsaBias :  -81.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.62231e-04 / 2
  ADC_P0  : -1.93254e-01 ± 2.41556e-02
  ADC_P1  : 1.13754e-02 ± 5.52833e-04
  ADC_P2  : -1.68011e-05 ± 2.48008e-06
  CSA_Chi2/NDF : 1.18467e-04 / 2
  CSA_P0  : 6.12609e-02 ± 7.25974e-03
  CSA_P1  : 9.44308e-03 ± 5.46969e-04
  CSA_P2  : -4.02032e-05 ± 8.32969e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [24, 33, 39, 52, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 22, 60, 88, 105, 106, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4036', '1.800', '0.1723', '1.800', '0.0927', '7.000', '0.7079', 1, 1, 1, 1, 1726146471.642065]
VI_after__Init : ['1.202', '0.4039', '1.800', '0.1725', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1726146479.7304623]
VI_at__the_End : ['1.202', '0.4927', '1.800', '0.1396', '1.800', '0.1144', '7.000', '0.7086', 1, 1, 1, 1, 1726146546.6442506]