TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_01_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-010-11 | FUSED_ID : 6359364768399151275
  IC_TEMP :  -54.37 | VDDM : 1124.50 | AUX_INT :   -8.79 | CsaBias :   80.36
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54838e-03 / 2
  ADC_P0  : -8.78854e-03 ± 2.66718e-02
  ADC_P1  : 8.16491e-03 ± 6.34092e-04
  ADC_P2  : -5.50565e-06 ± 3.00152e-06
  CSA_Chi2/NDF : 1.08738e-04 / 2
  CSA_P0  : 5.92323e-02 ± 6.95526e-03
  CSA_P1  : 9.60095e-03 ± 5.24029e-04
  CSA_P2  : -4.24615e-05 ± 7.98034e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [19, 78, 83, 88, 95, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [32, 70, 102, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0623', '1.800', '0.1738', '1.800', '0.0813', '7.000', '0.7081', 1, 1, 1, 1, 1726146083.089623]
VI_after__Init : ['1.202', '0.0622', '1.800', '0.1737', '1.800', '0.0755', '7.000', '0.7079', 1, 1, 1, 1, 1726146091.2240984]
VI_at__the_End : ['1.202', '0.4919', '1.800', '0.1389', '1.800', '0.1133', '7.000', '0.7086', 1, 1, 1, 1, 1726146157.895433]