TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_56_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-013-11 | FUSED_ID : 6359364768399151323
  IC_TEMP :  -48.45 | VDDM : 1131.59 | AUX_INT :   -9.76 | CsaBias :   70.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76211e-03 / 2
  ADC_P0  : -9.76345e-03 ± 2.84677e-02
  ADC_P1  : 8.09447e-03 ± 6.65116e-04
  ADC_P2  : -5.76197e-06 ± 3.08233e-06
  CSA_Chi2/NDF : 8.05730e-05 / 2
  CSA_P0  : 6.02010e-02 ± 5.98711e-03
  CSA_P1  : 9.54705e-03 ± 4.51085e-04
  CSA_P2  : -3.98896e-05 ± 6.86950e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 28, 50, 65, 85, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [45, 68, 69, 72, 77, 93, 99, 103, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3043', '1.800', '0.1720', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1726145790.44486]
VI_after__Init : ['1.202', '0.3044', '1.800', '0.1721', '1.800', '0.0873', '7.000', '0.7078', 1, 1, 1, 1, 1726145799.2771683]
VI_at__the_End : ['1.202', '0.5002', '1.800', '0.1398', '1.800', '0.1103', '7.000', '0.7083', 1, 1, 1, 1, 1726145863.4593263]