TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_48_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-018-12 | FUSED_ID : 6359364768399151404
  IC_TEMP :  -50.99 | VDDM : 1130.15 | AUX_INT :   -6.23 | CsaBias :   84.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15500e-03 / 2
  ADC_P0  : -6.22599e-03 ± 2.30627e-02
  ADC_P1  : 8.30111e-03 ± 5.73439e-04
  ADC_P2  : -5.13556e-06 ± 2.82252e-06
  CSA_Chi2/NDF : 7.48823e-05 / 2
  CSA_P0  : 6.06143e-02 ± 5.77181e-03
  CSA_P1  : 9.39509e-03 ± 4.34864e-04
  CSA_P2  : -3.80367e-05 ± 6.62247e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [20, 71, 73, 98, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [3, 11, 15, 17, 57, 79, 91, 107, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2072', '1.800', '0.1485', '1.800', '0.0868', '7.000', '0.7075', 1, 1, 1, 1, 1726145305.982858]
VI_after__Init : ['1.202', '0.2072', '1.800', '0.1484', '1.800', '0.0816', '7.000', '0.7073', 1, 1, 1, 1, 1726145314.064272]
VI_at__the_End : ['1.202', '0.4967', '1.800', '0.1388', '1.800', '0.1118', '7.000', '0.7080', 1, 1, 1, 1, 1726145381.5472107]