TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_46_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-019-12 | FUSED_ID : 6359364768399151420
  IC_TEMP :  -52.76 | VDDM : 1124.62 | AUX_INT :   -6.61 | CsaBias :   74.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.95725e-04 / 2
  ADC_P0  : -6.60972e-03 ± 1.90728e-02
  ADC_P1  : 8.12886e-03 ± 4.55154e-04
  ADC_P2  : -5.62421e-06 ± 2.14432e-06
  CSA_Chi2/NDF : 8.84170e-05 / 2
  CSA_P0  : 5.75949e-02 ± 6.27177e-03
  CSA_P1  : 9.65736e-03 ± 4.72533e-04
  CSA_P2  : -4.13736e-05 ± 7.19611e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [22, 26, 28, 53, 59, 73, 87, 97, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [30, 45, 70, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4554', '1.800', '0.1447', '1.800', '0.0996', '7.000', '0.7075', 1, 1, 1, 1, 1726145208.666148]
VI_after__Init : ['1.202', '0.4555', '1.800', '0.1447', '1.800', '0.0947', '7.000', '0.7072', 1, 1, 1, 1, 1726145216.7034743]
VI_at__the_End : ['1.202', '0.4984', '1.800', '0.1365', '1.800', '0.1111', '7.000', '0.7080', 1, 1, 1, 1, 1726145276.2880316]