TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_45_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-020-12 | FUSED_ID : 6359364768399151436
  IC_TEMP :  -51.01 | VDDM : 1130.98 | AUX_INT :   -7.43 | CsaBias :   88.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09712e-03 / 2
  ADC_P0  : -7.43100e-03 ± 2.24610e-02
  ADC_P1  : 8.03580e-03 ± 5.36131e-04
  ADC_P2  : -4.99864e-06 ± 2.53557e-06
  CSA_Chi2/NDF : 7.66629e-05 / 2
  CSA_P0  : 5.99237e-02 ± 5.84003e-03
  CSA_P1  : 9.35237e-03 ± 4.40004e-04
  CSA_P2  : -3.71303e-05 ± 6.70074e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 22, 34, 47, 79, 105, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [30, 104, 108, 110, 124, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4670', '1.800', '0.1332', '1.800', '0.0952', '7.000', '0.7073', 1, 1, 1, 1, 1726145111.8392503]
VI_after__Init : ['1.202', '0.4673', '1.800', '0.1333', '1.800', '0.0893', '7.000', '0.7073', 1, 1, 1, 1, 1726145119.9156945]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1368', '1.800', '0.1114', '7.000', '0.7079', 1, 1, 1, 1, 1726145179.5711668]