TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_43_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-021-12 | FUSED_ID : 6359364768399151452
  IC_TEMP :  -50.59 | VDDM : 1132.15 | AUX_INT :   -7.86 | CsaBias :   88.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18187e-03 / 2
  ADC_P0  : -7.85745e-03 ± 2.32885e-02
  ADC_P1  : 8.09393e-03 ± 5.51267e-04
  ADC_P2  : -5.56145e-06 ± 2.58149e-06
  CSA_Chi2/NDF : 7.34679e-05 / 2
  CSA_P0  : 5.97473e-02 ± 5.71704e-03
  CSA_P1  : 9.35986e-03 ± 4.30738e-04
  CSA_P2  : -3.70388e-05 ± 6.55962e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [38, 54, 64, 70, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 13, 30, 75, 107, 112, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2625', '1.800', '0.1542', '1.800', '0.0932', '7.000', '0.7083', 1, 1, 1, 1, 1726145014.0204477]
VI_after__Init : ['1.202', '0.2626', '1.800', '0.1542', '1.800', '0.0863', '7.000', '0.7075', 1, 1, 1, 1, 1726145022.2228584]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1372', '1.800', '0.1121', '7.000', '0.7079', 1, 1, 1, 1, 1726145089.7768366]