TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_41_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-022-12 | FUSED_ID : 6359364768399151468
  IC_TEMP :  -49.19 | VDDM : 1130.90 | AUX_INT :   -7.23 | CsaBias :   87.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46650e-03 / 2
  ADC_P0  : -7.22893e-03 ± 2.60407e-02
  ADC_P1  : 7.92313e-03 ± 6.21725e-04
  ADC_P2  : -4.29238e-06 ± 2.95184e-06
  CSA_Chi2/NDF : 7.80256e-05 / 2
  CSA_P0  : 5.90164e-02 ± 5.89170e-03
  CSA_P1  : 9.26569e-03 ± 4.43897e-04
  CSA_P2  : -3.56184e-05 ± 6.76003e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [9, 15, 17, 46, 77, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 34, 39, 74]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1497', '1.800', '0.1831', '1.800', '0.0824', '7.000', '0.7081', 1, 1, 1, 1, 1726144916.9955492]
VI_after__Init : ['1.202', '0.1496', '1.800', '0.1831', '1.800', '0.0751', '7.000', '0.7072', 1, 1, 1, 1, 1726144925.0778763]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1387', '1.800', '0.1101', '7.000', '0.7081', 1, 1, 1, 1, 1726144988.3092856]