TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_40_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-023-12 | FUSED_ID : 6359364768399151484
  IC_TEMP :  -54.02 | VDDM : 1132.15 | AUX_INT :   -7.86 | CsaBias :   88.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18187e-03 / 2
  ADC_P0  : -7.85745e-03 ± 2.32885e-02
  ADC_P1  : 8.09393e-03 ± 5.51267e-04
  ADC_P2  : -5.56145e-06 ± 2.58149e-06
  CSA_Chi2/NDF : 8.18476e-05 / 2
  CSA_P0  : 5.76876e-02 ± 6.03428e-03
  CSA_P1  : 9.57742e-03 ± 4.54639e-04
  CSA_P2  : -4.01096e-05 ± 6.92362e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [42, 71, 80, 81, 86, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 50, 113, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1955', '1.800', '0.1322', '1.800', '0.0938', '7.000', '0.7077', 1, 1, 1, 1, 1726144819.5156226]
VI_after__Init : ['1.202', '0.1955', '1.800', '0.1322', '1.800', '0.0864', '7.000', '0.7072', 1, 1, 1, 1, 1726144828.4150484]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1391', '1.800', '0.1107', '7.000', '0.7076', 1, 1, 1, 1, 1726144895.4649928]