TEST_NAME : Wafer
TEST_DATE : 24_09_12-14_37_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-013-025-12 | FUSED_ID : 6359364768399151516
  IC_TEMP :  -54.41 | VDDM : 1137.30 | AUX_INT :   -6.51 | CsaBias :   81.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11407e-03 / 2
  ADC_P0  : -6.51133e-03 ± 2.26337e-02
  ADC_P1  : 8.01979e-03 ± 5.40255e-04
  ADC_P2  : -4.93960e-06 ± 2.55507e-06
  CSA_Chi2/NDF : 7.23506e-05 / 2
  CSA_P0  : 5.79468e-02 ± 5.67340e-03
  CSA_P1  : 9.37827e-03 ± 4.27450e-04
  CSA_P2  : -3.69097e-05 ± 6.50955e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [8, 14, 16, 18, 28, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [6, 8, 36, 43, 79, 116, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3207', '1.800', '0.1476', '1.800', '0.0887', '7.000', '0.7069', 1, 1, 1, 1, 1726144625.2296467]
VI_after__Init : ['1.202', '0.3205', '1.800', '0.1466', '1.800', '0.0827', '7.000', '0.7069', 1, 1, 1, 1, 1726144633.3960762]
VI_at__the_End : ['1.202', '0.4975', '1.800', '0.1313', '1.800', '0.1104', '7.000', '0.7079', 1, 1, 1, 1, 1726144694.414638]