TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_14_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-003-05 | FUSED_ID : 6359364768399155253
  IC_TEMP :  -54.31 | VDDM : 1129.12 | AUX_INT :   -8.03 | CsaBias :   86.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73138e-04 / 2
  ADC_P0  : -8.02638e-03 ± 2.10696e-02
  ADC_P1  : 8.70466e-03 ± 5.27832e-04
  ADC_P2  : -6.90008e-06 ± 2.61871e-06
  CSA_Chi2/NDF : 1.06831e-04 / 2
  CSA_P0  : 5.62237e-02 ± 6.89401e-03
  CSA_P1  : 9.65593e-03 ± 5.19414e-04
  CSA_P2  : -4.10183e-05 ± 7.91006e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [20, 40, 81, 97, 98, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [28, 34, 83, 86, 105, 117, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3371', '1.800', '0.1457', '1.800', '0.0881', '7.000', '0.7080', 1, 1, 1, 1, 1726146860.4335299]
VI_after__Init : ['1.202', '0.3372', '1.800', '0.1457', '1.800', '0.0828', '7.000', '0.7078', 1, 1, 1, 1, 1726146869.2127447]
VI_at__the_End : ['1.202', '0.4981', '1.800', '0.1389', '1.800', '0.1090', '7.000', '0.7086', 1, 1, 1, 1, 1726146929.6900933]