TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_17_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-005-05 | FUSED_ID : 6359364768399155285
  IC_TEMP :  -50.95 | VDDM : 1124.37 | AUX_INT :   -6.51 | CsaBias :   89.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11407e-03 / 2
  ADC_P0  : -6.51133e-03 ± 2.26337e-02
  ADC_P1  : 8.01979e-03 ± 5.40255e-04
  ADC_P2  : -4.93960e-06 ± 2.55507e-06
  CSA_Chi2/NDF : 1.10460e-04 / 2
  CSA_P0  : 5.89119e-02 ± 7.01012e-03
  CSA_P1  : 9.79716e-03 ± 5.28162e-04
  CSA_P2  : -4.27920e-05 ± 8.04328e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [87, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [54, 63, 70, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2051', '1.800', '0.1772', '1.800', '0.0855', '7.000', '0.7079', 1, 1, 1, 1, 1726147054.5215077]
VI_after__Init : ['1.202', '0.2052', '1.800', '0.1770', '1.800', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1726147063.2677317]
VI_at__the_End : ['1.202', '0.5025', '1.800', '0.1387', '1.800', '0.1113', '7.000', '0.7086', 1, 1, 1, 1, 1726147129.700708]