TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_19_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-006-05 | FUSED_ID : 6359364768399155301
  IC_TEMP :  -49.63 | VDDM : 1127.73 | AUX_INT :   -8.35 | CsaBias :   95.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58927e-03 / 2
  ADC_P0  : -8.35002e-03 ± 2.70704e-02
  ADC_P1  : 8.01429e-03 ± 6.39637e-04
  ADC_P2  : -4.95608e-06 ± 3.00971e-06
  CSA_Chi2/NDF : 1.11487e-04 / 2
  CSA_P0  : 5.89167e-02 ± 7.04262e-03
  CSA_P1  : 9.82755e-03 ± 5.30611e-04
  CSA_P2  : -4.28922e-05 ± 8.08058e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 53, 76, 79, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 40, 68, 92, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2000', '1.800', '0.1519', '1.800', '0.0871', '7.000', '0.7078', 1, 1, 1, 1, 1726147151.819957]
VI_after__Init : ['1.201', '0.1998', '1.800', '0.1512', '1.800', '0.0814', '7.000', '0.7081', 1, 1, 1, 1, 1726147159.8732147]
VI_at__the_End : ['1.202', '0.5040', '1.800', '0.1390', '1.800', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1726147226.4301326]