TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_22_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-008-05 | FUSED_ID : 6359364768399155333
  IC_TEMP :  -48.50 | VDDM : 1131.00 | AUX_INT :   -6.46 | CsaBias :   82.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.86753e-04 / 2
  ADC_P0  : -6.46104e-03 ± 2.01853e-02
  ADC_P1  : 8.09906e-03 ± 4.90006e-04
  ADC_P2  : -4.90691e-06 ± 2.35287e-06
  CSA_Chi2/NDF : 1.22619e-04 / 2
  CSA_P0  : 5.97417e-02 ± 7.38585e-03
  CSA_P1  : 1.01120e-02 ± 5.56471e-04
  CSA_P2  : -4.61303e-05 ± 8.47439e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 38, 68, 70, 98, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 26, 52, 75, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3874', '1.800', '0.1571', '1.800', '0.0980', '7.000', '0.7079', 1, 1, 1, 1, 1726147345.213017]
VI_after__Init : ['1.202', '0.3875', '1.800', '0.1571', '1.800', '0.0926', '7.000', '0.7082', 1, 1, 1, 1, 1726147353.2113972]
VI_at__the_End : ['1.202', '0.5078', '1.800', '0.1414', '1.800', '0.1111', '7.000', '0.7088', 1, 1, 1, 1, 1726147420.0931954]