TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_24_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-009-05 | FUSED_ID : 6359364768399155349
  IC_TEMP :  -47.72 | VDDM : 1134.29 | AUX_INT :   -7.50 | CsaBias :   96.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21421e-03 / 2
  ADC_P0  : -7.50211e-03 ± 2.36432e-02
  ADC_P1  : 7.50992e-03 ± 5.29840e-04
  ADC_P2  : -4.02903e-06 ± 2.36746e-06
  CSA_Chi2/NDF : 6.04109e-05 / 2
  CSA_P0  : 5.82271e-02 ± 5.18418e-03
  CSA_P1  : 9.21830e-03 ± 3.90591e-04
  CSA_P2  : -3.59123e-05 ± 5.94823e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 28, 49, 52, 68, 103, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [21, 37, 108, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3400', '1.800', '0.1552', '1.800', '0.0893', '7.000', '0.7083', 1, 1, 1, 1, 1726147442.4465363]
VI_after__Init : ['1.202', '0.3398', '1.800', '0.1553', '1.800', '0.0839', '7.000', '0.7081', 1, 1, 1, 1, 1726147450.6719334]
VI_at__the_End : ['1.202', '0.4955', '1.800', '0.1359', '1.800', '0.1102', '7.000', '0.7084', 1, 1, 1, 1, 1726147518.0437458]