TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_28_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-012-05 | FUSED_ID : 6359364768399155397
  IC_TEMP :  -51.37 | VDDM : 1133.73 | AUX_INT :   -6.36 | CsaBias :   74.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.36082e-04 / 2
  ADC_P0  : -6.35878e-03 ± 2.07329e-02
  ADC_P1  : 8.11528e-03 ± 5.01661e-04
  ADC_P2  : -5.17305e-06 ± 2.39557e-06
  CSA_Chi2/NDF : 9.47850e-05 / 2
  CSA_P0  : 6.28291e-02 ± 6.49370e-03
  CSA_P1  : 9.79462e-03 ± 4.89253e-04
  CSA_P2  : -4.27234e-05 ± 7.45075e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 18, 20, 56, 85, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [10, 17, 24, 25, 33, 35, 49, 56, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1359', '1.800', '0.1595', '1.800', '0.0909', '7.000', '0.7079', 1, 1, 1, 1, 1726147734.057009]
VI_after__Init : ['1.202', '0.1359', '1.800', '0.1596', '1.800', '0.0853', '7.000', '0.7080', 1, 1, 1, 1, 1726147742.2594469]
VI_at__the_End : ['1.202', '0.5069', '1.800', '0.1408', '1.800', '0.1120', '7.000', '0.7089', 1, 1, 1, 1, 1726147807.3765614]