TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_32_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-014-05 | FUSED_ID : 6359364768399155429
  IC_TEMP :  -49.58 | VDDM : 1133.56 | AUX_INT :   -4.56 | CsaBias :   76.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.59380e-04 / 2
  ADC_P0  : -4.56239e-03 ± 1.73489e-02
  ADC_P1  : 8.19212e-03 ± 4.19712e-04
  ADC_P2  : -5.74672e-06 ± 1.99657e-06
  CSA_Chi2/NDF : 1.04550e-04 / 2
  CSA_P0  : 5.93252e-02 ± 6.82001e-03
  CSA_P1  : 9.65747e-03 ± 5.13839e-04
  CSA_P2  : -4.04823e-05 ± 7.82516e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [27, 42, 46, 69, 81, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 19, 66, 67, 115, 116, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2872', '1.800', '0.1321', '1.800', '0.0884', '7.000', '0.7079', 1, 1, 1, 1, 1726147927.964257]
VI_after__Init : ['1.202', '0.2872', '1.800', '0.1321', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1726147936.9155614]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1399', '1.802', '0.1111', '7.000', '0.7086', 1, 1, 1, 1, 1726147995.0920112]