TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_33_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-015-05 | FUSED_ID : 6359364768399155445
  IC_TEMP :  -50.37 | VDDM : 1127.68 | AUX_INT :   -7.45 | CsaBias :   86.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12069e-03 / 2
  ADC_P0  : -7.45319e-03 ± 2.26865e-02
  ADC_P1  : 7.91589e-03 ± 5.29242e-04
  ADC_P2  : -5.13327e-06 ± 2.44186e-06
  CSA_Chi2/NDF : 6.53806e-05 / 2
  CSA_P0  : 5.93189e-02 ± 5.39320e-03
  CSA_P1  : 9.45804e-03 ± 4.06339e-04
  CSA_P2  : -3.90338e-05 ± 6.18806e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [22, 28, 44, 64, 66, 94, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [47, 71, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1335', '1.800', '0.1599', '1.800', '0.0813', '7.000', '0.7079', 1, 1, 1, 1, 1726148025.5207622]
VI_after__Init : ['1.202', '0.1335', '1.800', '0.1599', '1.800', '0.0761', '7.000', '0.7081', 1, 1, 1, 1, 1726148033.7431073]
VI_at__the_End : ['1.202', '0.4981', '1.800', '0.1359', '1.800', '0.1112', '7.000', '0.7085', 1, 1, 1, 1, 1726148102.223818]