TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_35_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-016-02 | FUSED_ID : 6359364768399155458
  IC_TEMP :  -52.35 | VDDM : 1109.13 | AUX_INT :   -6.80 | CsaBias :   80.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00280e-03 / 2
  ADC_P0  : -6.80458e-03 ± 2.14268e-02
  ADC_P1  : 8.03593e-03 ± 5.04477e-04
  ADC_P2  : -5.39569e-06 ± 2.35400e-06
  CSA_Chi2/NDF : 7.89550e-05 / 2
  CSA_P0  : 5.88400e-02 ± 5.92669e-03
  CSA_P1  : 9.53372e-03 ± 4.46533e-04
  CSA_P2  : -4.11309e-05 ± 6.80017e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [15, 38, 53, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [1, 10, 13, 26, 54, 56, 81, 84, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3901', '1.800', '0.1674', '1.800', '0.0926', '7.000', '0.7078', 1, 1, 1, 1, 1726148122.4232502]
VI_after__Init : ['1.202', '0.3902', '1.800', '0.1675', '1.800', '0.0872', '7.000', '0.7080', 1, 1, 1, 1, 1726148130.6656127]
VI_at__the_End : ['1.202', '0.4932', '1.800', '0.1376', '1.800', '0.1121', '7.000', '0.7085', 1, 1, 1, 1, 1726148197.1224213]