TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_36_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-017-02 | FUSED_ID : 6359364768399155474
  IC_TEMP :  -49.64 | VDDM : 1129.28 | AUX_INT :   -5.10 | CsaBias :   68.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.43237e-04 / 2
  ADC_P0  : -5.09719e-03 ± 1.84585e-02
  ADC_P1  : 8.19330e-03 ± 4.53397e-04
  ADC_P2  : -5.09217e-06 ± 2.20076e-06
  CSA_Chi2/NDF : 8.52272e-05 / 2
  CSA_P0  : 5.95880e-02 ± 6.15760e-03
  CSA_P1  : 9.67706e-03 ± 4.63931e-04
  CSA_P2  : -4.15454e-05 ± 7.06511e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [14, 67, 76, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [55, 92, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3449', '1.800', '0.1249', '1.800', '0.0865', '7.000', '0.7079', 1, 1, 1, 1, 1726148219.237797]
VI_after__Init : ['1.202', '0.3449', '1.800', '0.1249', '1.800', '0.0810', '7.000', '0.7077', 1, 1, 1, 1, 1726148227.3271465]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1404', '1.800', '0.1107', '7.000', '0.7085', 1, 1, 1, 1, 1726148286.9775252]