TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_43_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-021-02 | FUSED_ID : 6359364768399155538
  IC_TEMP :  -51.46 | VDDM : 1121.61 | AUX_INT :   -8.54 | CsaBias :   80.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21705e-03 / 2
  ADC_P0  : -8.54158e-03 ± 2.36223e-02
  ADC_P1  : 8.12491e-03 ± 5.57998e-04
  ADC_P2  : -5.64326e-06 ± 2.61534e-06
  CSA_Chi2/NDF : 1.02714e-04 / 2
  CSA_P0  : 5.88842e-02 ± 6.75987e-03
  CSA_P1  : 9.80019e-03 ± 5.09307e-04
  CSA_P2  : -4.24402e-05 ± 7.75615e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [31, 81, 90, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [15, 21, 25, 38, 72, 89, 111, 117, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2491', '1.800', '0.1122', '1.800', '0.0898', '7.001', '0.7079', 1, 1, 1, 1, 1726148608.6678395]
VI_after__Init : ['1.202', '0.2491', '1.800', '0.1122', '1.800', '0.0842', '7.000', '0.7079', 1, 1, 1, 1, 1726148616.9162376]
VI_at__the_End : ['1.202', '0.5025', '1.800', '0.1377', '1.800', '0.1109', '7.000', '0.7086', 1, 1, 1, 1, 1726148677.2156322]