TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_48_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-024-02 | FUSED_ID : 6359364768399155586
  IC_TEMP :  -49.85 | VDDM : 1125.78 | AUX_INT :   -8.81 | CsaBias :   88.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68676e-03 / 2
  ADC_P0  : -8.80504e-03 ± 2.78787e-02
  ADC_P1  : 8.19865e-03 ± 6.68525e-04
  ADC_P2  : -5.39731e-06 ± 3.19350e-06
  CSA_Chi2/NDF : 1.14611e-04 / 2
  CSA_P0  : 6.00280e-02 ± 7.14062e-03
  CSA_P1  : 9.77733e-03 ± 5.37994e-04
  CSA_P2  : -4.13261e-05 ± 8.19301e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [47, 88, 116, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 16, 23, 62, 81, 82, 115, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2394', '1.800', '0.1676', '1.800', '0.0825', '7.000', '0.7079', 1, 1, 1, 1, 1726148899.1026366]
VI_after__Init : ['1.202', '0.2394', '1.800', '0.1676', '1.800', '0.0774', '7.000', '0.7081', 1, 1, 1, 1, 1726148907.821822]
VI_at__the_End : ['1.202', '0.5083', '1.800', '0.1401', '1.800', '0.1114', '7.000', '0.7087', 1, 1, 1, 1, 1726148967.8532507]