TEST_NAME : Wafer
TEST_DATE : 24_09_12-15_49_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-014-025-02 | FUSED_ID : 6359364768399155602
  IC_TEMP :  -55.48 | VDDM : 1110.16 | AUX_INT :   -8.00 | CsaBias :   81.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06524e-03 / 2
  ADC_P0  : -7.99831e-03 ± 2.20676e-02
  ADC_P1  : 8.24783e-03 ± 5.25609e-04
  ADC_P2  : -6.14127e-06 ± 2.47615e-06
  CSA_Chi2/NDF : 1.24282e-04 / 2
  CSA_P0  : 5.73537e-02 ± 7.43579e-03
  CSA_P1  : 9.69985e-03 ± 5.60233e-04
  CSA_P2  : -4.36443e-05 ± 8.53168e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 53, 61, 77, 80, 94, 103, 105, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [26, 70, 91, 99, 104, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3273', '1.800', '0.1508', '1.800', '0.0956', '7.000', '0.7083', 1, 1, 1, 1, 1726148995.5542536]
VI_after__Init : ['1.202', '0.3271', '1.800', '0.1509', '1.800', '0.0901', '7.000', '0.7081', 1, 1, 1, 1, 1726149003.739522]
VI_at__the_End : ['1.202', '0.4938', '1.800', '0.1352', '1.800', '0.1111', '7.000', '0.7090', 1, 1, 1, 1, 1726149064.4789116]