TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_27_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-004-08 | FUSED_ID : 6359364768399159368
  IC_TEMP :  -51.31 | VDDM : 1126.93 | AUX_INT :   -8.50 | CsaBias :   83.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.29688e-04 / 2
  CSA_P0  : 5.73731e-02 ± 7.59578e-03
  CSA_P1  : 9.61665e-03 ± 5.72287e-04
  CSA_P2  : -4.13760e-05 ± 8.71525e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [6, 43, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 34, 51, 62, 74, 110, 116, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2867', '1.800', '0.1459', '1.800', '0.0863', '7.000', '0.7073', 1, 1, 1, 1, 1726151231.6596687]
VI_after__Init : ['1.202', '0.2866', '1.800', '0.1459', '1.800', '0.0805', '7.000', '0.7071', 1, 1, 1, 1, 1726151240.506913]
VI_at__the_End : ['1.201', '0.4937', '1.800', '0.1381', '1.800', '0.1109', '7.000', '0.7080', 1, 1, 1, 1, 1726151303.9921868]