TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_25_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-005-08 | FUSED_ID : 6359364768399159384
  IC_TEMP :  -50.31 | VDDM : 1135.63 | AUX_INT :  -10.26 | CsaBias :   96.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52320e-03 / 2
  ADC_P0  : -1.02634e-02 ± 2.64212e-02
  ADC_P1  : 8.31977e-03 ± 6.35949e-04
  ADC_P2  : -5.70703e-06 ± 3.06168e-06
  CSA_Chi2/NDF : 8.69445e-05 / 2
  CSA_P0  : 5.95916e-02 ± 6.21933e-03
  CSA_P1  : 9.10995e-03 ± 4.68581e-04
  CSA_P2  : -3.29327e-05 ± 7.13594e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [15, 42, 66, 79, 88, 105, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 33, 56, 62, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4798', '1.800', '0.1551', '1.800', '0.0902', '7.000', '0.7069', 1, 1, 1, 1, 1726151134.6977918]
VI_after__Init : ['1.202', '0.4801', '1.800', '0.1551', '1.800', '0.0844', '7.000', '0.7072', 1, 1, 1, 1, 1726151142.7463222]
VI_at__the_End : ['1.201', '0.5008', '1.800', '0.1382', '1.800', '0.1083', '7.000', '0.7081', 1, 1, 1, 1, 1726151204.4856637]