TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_22_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-007-08 | FUSED_ID : 6359364768399159416
  IC_TEMP :  -51.21 | VDDM : 1133.26 | AUX_INT :   -6.42 | CsaBias :   75.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00700e-03 / 2
  ADC_P0  : -6.41614e-03 ± 2.15115e-02
  ADC_P1  : 8.25119e-03 ± 5.31268e-04
  ADC_P2  : -5.24383e-06 ± 2.58807e-06
  CSA_Chi2/NDF : 1.48965e-04 / 2
  CSA_P0  : 5.82494e-02 ± 8.14075e-03
  CSA_P1  : 1.02226e-02 ± 6.13347e-04
  CSA_P2  : -4.78677e-05 ± 9.34055e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 42, 80, 97, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [3, 66, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3009', '1.800', '0.1321', '1.800', '0.0883', '7.000', '0.7072', 1, 1, 1, 1, 1726150940.5593333]
VI_after__Init : ['1.201', '0.3011', '1.800', '0.1320', '1.800', '0.0826', '7.000', '0.7073', 1, 1, 1, 1, 1726150948.7147605]
VI_at__the_End : ['1.201', '0.5080', '1.800', '0.1406', '1.800', '0.1104', '7.000', '0.7079', 1, 1, 1, 1, 1726151016.6837327]