TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_17_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-010-08 | FUSED_ID : 6359364768399159464
  IC_TEMP :  -50.17 | VDDM : 1133.76 | AUX_INT :   -7.66 | CsaBias :   86.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17143e-03 / 2
  ADC_P0  : -7.66311e-03 ± 2.31943e-02
  ADC_P1  : 7.91026e-03 ± 5.41089e-04
  ADC_P2  : -5.09751e-06 ± 2.49653e-06
  CSA_Chi2/NDF : 1.11964e-04 / 2
  CSA_P0  : 5.67942e-02 ± 7.05767e-03
  CSA_P1  : 9.92388e-03 ± 5.31744e-04
  CSA_P2  : -4.31043e-05 ± 8.09784e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 4, 20, 64, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [28, 41, 44, 48, 50, 107, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2459', '1.800', '0.1318', '1.800', '0.0893', '7.000', '0.7076', 1, 1, 1, 1, 1726150649.2779098]
VI_after__Init : ['1.202', '0.2459', '1.800', '0.1318', '1.800', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1726150657.2673056]
VI_at__the_End : ['1.202', '0.5078', '1.800', '0.1385', '1.800', '0.1095', '7.000', '0.7079', 1, 1, 1, 1, 1726150723.235481]