TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_14_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-012-08 | FUSED_ID : 6359364768399159496
  IC_TEMP :  -50.62 | VDDM : 1130.49 | AUX_INT :   -8.61 | CsaBias :   80.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28976e-03 / 2
  ADC_P0  : -8.61256e-03 ± 2.43104e-02
  ADC_P1  : 8.13141e-03 ± 5.72493e-04
  ADC_P2  : -5.83500e-06 ± 2.66893e-06
  CSA_Chi2/NDF : 6.81746e-05 / 2
  CSA_P0  : 5.99046e-02 ± 5.50723e-03
  CSA_P1  : 9.34201e-03 ± 4.14930e-04
  CSA_P2  : -3.87400e-05 ± 6.31890e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [30, 36, 39, 48, 61, 82, 99, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [52, 68, 69, 108, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2918', '1.800', '0.1635', '1.800', '0.0908', '7.000', '0.7077', 1, 1, 1, 1, 1726150454.3472195]
VI_after__Init : ['1.202', '0.2918', '1.800', '0.1635', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1726150462.4865696]
VI_at__the_End : ['1.202', '0.4925', '1.800', '0.1352', '1.800', '0.1120', '7.000', '0.7084', 1, 1, 1, 1, 1726150523.2151756]