TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_12_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-013-08 | FUSED_ID : 6359364768399159512
  IC_TEMP :  -51.19 | VDDM : 1135.47 | AUX_INT :   -6.93 | CsaBias :   90.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18001e-03 / 2
  ADC_P0  : -6.93165e-03 ± 2.32851e-02
  ADC_P1  : 8.20429e-03 ± 5.64149e-04
  ADC_P2  : -5.38048e-06 ± 2.70895e-06
  CSA_Chi2/NDF : 8.42893e-05 / 2
  CSA_P0  : 6.02400e-02 ± 6.12363e-03
  CSA_P1  : 9.16257e-03 ± 4.61371e-04
  CSA_P2  : -3.48271e-05 ± 7.02613e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [4, 8, 39, 41, 47, 49, 96, 102, 115, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [25, 50, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3854', '1.800', '0.1352', '1.800', '0.0936', '7.000', '0.7078', 1, 1, 1, 1, 1726150357.4512696]
VI_after__Init : ['1.202', '0.3854', '1.800', '0.1353', '1.800', '0.0882', '7.000', '0.7078', 1, 1, 1, 1, 1726150365.707577]
VI_at__the_End : ['1.202', '0.4959', '1.800', '0.1396', '1.800', '0.1104', '7.000', '0.7084', 1, 1, 1, 1, 1726150429.6939082]