TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_11_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-014-08 | FUSED_ID : 6359364768399159528
  IC_TEMP :  -49.23 | VDDM : 1117.48 | AUX_INT :   -5.54 | CsaBias :   84.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.16802e-04 / 2
  ADC_P0  : -5.54220e-03 ± 1.93298e-02
  ADC_P1  : 8.25487e-03 ± 4.70714e-04
  ADC_P2  : -5.70103e-06 ± 2.26177e-06
  CSA_Chi2/NDF : 8.75607e-05 / 2
  CSA_P0  : 6.12569e-02 ± 6.24133e-03
  CSA_P1  : 9.67932e-03 ± 4.70239e-04
  CSA_P2  : -4.13606e-05 ± 7.16118e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [36, 53, 58, 79, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [22, 49, 50, 88, 106, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1002', '1.800', '0.1731', '1.800', '0.0809', '7.000', '0.7079', 1, 1, 1, 1, 1726150260.1232781]
VI_after__Init : ['1.202', '0.1002', '1.800', '0.1731', '1.800', '0.0753', '7.000', '0.7080', 1, 1, 1, 1, 1726150268.95466]
VI_at__the_End : ['1.202', '0.5034', '1.800', '0.1402', '1.800', '0.1111', '7.000', '0.7085', 1, 1, 1, 1, 1726150335.2228212]