TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_07_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-016-15 | FUSED_ID : 6359364768399159567
  IC_TEMP :  -50.11 | VDDM : 1113.16 | AUX_INT :   -6.24 | CsaBias :   84.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.51961e-04 / 2
  ADC_P0  : -6.23837e-03 ± 1.97326e-02
  ADC_P1  : 8.28732e-03 ± 4.79489e-04
  ADC_P2  : -5.78875e-06 ± 2.30606e-06
  CSA_Chi2/NDF : 1.09632e-04 / 2
  CSA_P0  : 6.16925e-02 ± 6.98380e-03
  CSA_P1  : 9.85944e-03 ± 5.26179e-04
  CSA_P2  : -4.31766e-05 ± 8.01308e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [23, 56, 62, 77, 80, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 10, 34, 76, 88, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2668', '1.800', '0.1683', '1.799', '0.0909', '7.000', '0.7080', 1, 1, 1, 1, 1726150066.3898678]
VI_after__Init : ['1.202', '0.2669', '1.800', '0.1683', '1.800', '0.0852', '7.000', '0.7079', 1, 1, 1, 1, 1726150074.4853053]
VI_at__the_End : ['1.202', '0.5090', '1.800', '0.1389', '1.800', '0.1111', '7.000', '0.7085', 1, 1, 1, 1, 1726150141.7806156]