TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_06_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-017-15 | FUSED_ID : 6359364768399159583
  IC_TEMP :  -54.99 | VDDM : 1132.03 | AUX_INT :   -5.98 | CsaBias :   90.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.80716e-04 / 2
  ADC_P0  : -5.98407e-03 ± 2.12057e-02
  ADC_P1  : 8.14354e-03 ± 5.10412e-04
  ADC_P2  : -5.43964e-06 ± 2.42641e-06
  CSA_Chi2/NDF : 9.68583e-05 / 2
  CSA_P0  : 5.97114e-02 ± 6.56434e-03
  CSA_P1  : 9.65910e-03 ± 4.94575e-04
  CSA_P2  : -4.23213e-05 ± 7.53180e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [45, 49, 62, 102, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [22, 27, 39, 54, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4052', '1.800', '0.1923', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1726149969.0026565]
VI_after__Init : ['1.202', '0.4054', '1.800', '0.1923', '1.800', '0.0819', '7.000', '0.7081', 1, 1, 1, 1, 1726149977.2390795]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1391', '1.800', '0.1107', '7.000', '0.7089', 1, 1, 1, 1, 1726150046.705303]