TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_02_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-019-15 | FUSED_ID : 6359364768399159615
  IC_TEMP :  -52.17 | VDDM : 1122.76 | AUX_INT :   -6.10 | CsaBias :   82.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.44995e-04 / 2
  ADC_P0  : -6.10148e-03 ± 2.08222e-02
  ADC_P1  : 8.12881e-03 ± 5.02791e-04
  ADC_P2  : -5.18520e-06 ± 2.40333e-06
  CSA_Chi2/NDF : 1.05003e-04 / 2
  CSA_P0  : 5.71358e-02 ± 6.83475e-03
  CSA_P1  : 9.84878e-03 ± 5.14949e-04
  CSA_P2  : -4.44505e-05 ± 7.84206e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 33, 41, 66, 117, 124, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [36, 83, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3393', '1.800', '0.1610', '1.799', '0.0944', '7.000', '0.7078', 1, 1, 1, 1, 1726149774.0165956]
VI_after__Init : ['1.202', '0.3395', '1.800', '0.1610', '1.800', '0.0887', '7.000', '0.7083', 1, 1, 1, 1, 1726149782.816897]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1379', '1.800', '0.1103', '7.000', '0.7087', 1, 1, 1, 1, 1726149844.9730399]