TEST_NAME : Wafer
TEST_DATE : 24_09_12-16_01_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-015-020-15 | FUSED_ID : 6359364768399159631
  IC_TEMP :  -50.90 | VDDM : 1120.38 | AUX_INT :   -9.05 | CsaBias :   78.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37505e-03 / 2
  ADC_P0  : -9.04595e-03 ± 2.51441e-02
  ADC_P1  : 8.00348e-03 ± 5.89108e-04
  ADC_P2  : -5.15740e-06 ± 2.74720e-06
  CSA_Chi2/NDF : 1.40330e-04 / 2
  CSA_P0  : 5.89556e-02 ± 7.90129e-03
  CSA_P1  : 9.95845e-03 ± 5.95305e-04
  CSA_P2  : -4.63223e-05 ± 9.06579e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 11, 62, 71, 80, 98, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [14, 17, 22, 61, 76, 97, 98, 101, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2816', '1.800', '0.1475', '1.800', '0.0960', '7.000', '0.7081', 1, 1, 1, 1, 1726149676.6250424]
VI_after__Init : ['1.202', '0.2817', '1.800', '0.1474', '1.800', '0.0901', '7.000', '0.7080', 1, 1, 1, 1, 1726149685.4144073]
VI_at__the_End : ['1.202', '0.5039', '1.800', '0.1365', '1.800', '0.1108', '7.000', '0.7085', 1, 1, 1, 1, 1726149745.4677005]